Advances in electron microscopy: High resolution TEM and latest advances in detection technology

Bio21 Institute 30 Flemington Rd, Parkville


This is the third seminar of the 2017 "Advances in Electron Microscopy Seminar Series".

JEOL will present their latest development in terms of TEM detection including but not limited to dual EDS detector systems for higher solid angle and detection speed, pixelated detectors for simultaneous capture of the spatially and angularly-resolved distribution of all transmitted electrons.

NO registration needed.