Scanning electron microscopy images surface topography of samples using secondary electrons and mass differences in samples using back scatter electrons. Attachments can also detect x-rays.
* High resolution scanning electron microscope * <1 kV to 30 kV * Secondary and backscatter electron imaging * In lens, secondary and backscatter detectors * Energy dispersive X-ray spectroscopy (EDS) for elemental analysis (Oxford UltimMax) * CryoSEM(Quorum) * Cathodoluminescence (Delmic)
Hitachi TM4000 II Plus
* Benchtop scanning electron microscope * 5-15 kV * Secondary electron imaging