Scanning electron microscopy

Scanning electron microscopy images surface topography of samples using secondary electrons and mass differences in samples using back scatter electrons. Attachments can also detect x-rays.

Hitachi SEM

Hitachi SU7000

* High resolution scanning electron microscope
* <1 kV to 30 kV
* Secondary and backscatter electron imaging
* In lens, secondary and backscatter detectors
* Energy dispersive X-ray spectroscopy (EDS) for elemental analysis (Oxford UltimMax)
* CryoSEM(Quorum)
* Cathodoluminescence (Delmic)

Hitachi Tabletop SEM

Hitachi TM4000 II Plus

* Benchtop scanning electron microscope
* 5-15 kV
* Secondary electron imaging